Dual-element Straight Beam Probe

Dual-element Straight Beam Probe

YUSHI has established in-depth cooperative relations with many universities and research institutes; At the same time, it actively lays out the international market, and its products are exported to Asia, Europe, America and Oceania, with a total of 66 countries and regions, and provides technical support for more than 3,000 international enterprises. At present, the company has built a modern production line, passed the ISO9001 quality management system and CE certification.
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Description
Technical Parameters
About YUSHI

 

YUSHI has established in-depth cooperative relations with many universities and research institutes; At the same time, it actively lays out the international market, and its products are exported to Asia, Europe, America and Oceania, with a total of 66 countries and regions, and provides technical support for more than 3,000 international enterprises. At present, the company has built a modern production line, passed the ISO9001 quality management system and CE certification.

As a R&D enterprise that adheres to innovation, YUSHI has been deeply engaged in the field of non-destructive testing for more than ten years, and has developed seven categories of products with independent intellectual property rights, including ultrasonic thickness gauge, YUSHI Ultrasonic Flaw Detector, Leeb Hardness Tester, Black and White Densitometer, and has obtained a number of patents, including 1 invention patent, 5 utility model patents, 2 design patents and 26 software copyrights, in line with GB/T29490-2013 certification standards.

 

 

Probe General Introduction

 

YUSHI Dual-element straight beam probes adopts high-quality and high-sensitivity wafers. The two longitudinal wave elements of a dual-element straight probe are used for emitting ultrasound and receiving ultrasound. Most of the transmitting piezoelectric wafers use lead zirconate titanate with good emission performance, and most of the receiving piezoelectric wafers use lithium sulfate with good receiving performance. Different from single element probes, dual element probes have higher emission sensitivity and reception sensitivity. There is a sound insulation layer with strong sound absorption and good insulation between the elements of the dual-element straight beam probes, which is not only used to overcome the mutual interference and blocking of the transmitted sound beam and the reflected sound beam, but also can make the pulse narrow, improve the resolution, and eliminate the reflected clutter between the transmitting element and the delay line into the receiving element, effectively reducing the clutter.

 

Composition of the probe

 

Piezoelectric wafers,Protective Film,Damping Blocks,Housing

product-795-429

 

Features of the dual-element straight beam probe

 

1.Anodized aluminum signage, laser lettering(Red is 10MHz,Green is 5MHz,Blue is4MHz,Yellow is 2MHz);

2.Adopt Aluminum alloy;

3.High-sensitivity;

4.Piezoelectric ceramic chip PT,PZT or compound chip;

5.Use BNC single crystal cable.

6.Zinc alloy die casting shell,Corundum protective film,Lead zirconate titanate ceramic water, Laser engraving.

product-797-431

 

Probe Specification

 

Model

Frequency

Size of element

Focal length

MHz

Mm.

In.

mm

in

2P11FG8

2

Φ11/2

0.43

8

0.3

2P12FG10

2

Φ12/2

0.47

10

0.4

4P3.5x10FG10

4

3.5x10

0.14x0.39

10

0.4

4P3.5x10FG18

4

3.5x10

0.14x0.39

18

0.7

5P10FG10

5

Φ10/2

0.39

10

0.4

2.5P20FG10

2.5

Φ20/2

0.79

10

0.4

2.5P20FG15

2.5

Φ20/2

0.79

15

0.6

2.5P20FG20

2.5

Φ20/2

0.79

20

0.8

2.5P20FG30

2.5

Φ20/2

0.79

30

1.2

5P20FG10

5

Φ20/2

0.79

10

0.4

5P20FG15

5

Φ20/2

0.79

15

0.6

5P20FG20

5

Φ20/2

0.79

20

0.8

5P20FG30

5

Φ20/2

0.79

30

1.2

 

product-795-405
product-796-431
product-796-431

 

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